ABSTRACT
RESTORATION OF ATOMIC FORCE MICROSCOPE IMAGES USING BLIND TIP ESTIMATION TECHNIQUE
Acta Electronica Malaysia (AEM)
Author: Ahmed Ahtaiba
This is an open access article distributed under the Creative Commons Attribution License CC BY 4.0, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited
DOI :10.26480/aem.01.2025.11.15
Accurate reconstruction of surface topography from Atomic Force Microscope (AFM) images is crucial for nanoscale characterization. This study investigates the application of a blind tip estimation algorithm, which leverages set theory and morphological operations, to address distortions caused by the AFM tip-sample interaction. The method, building on Villarrubia’s approach, allows for the estimation of the AFM tip shape directly from images of samples with unknown surface geometries. We present experimental results from two real samples: one featuring an array of square pillars and another with cylindrical pillars, demonstrating the efficacy of this restoration technique.
| Pages | 11-15 |
| Year | 2025 |
| Issue | 1 |
| Volume | 9 |
